OBSERVABLE OPTIMIZED SELECTIVE HARDENING OF COMBINATIONAL CIRCUITS AGAINST SOFT-ERROR

Q: How can I download an article?

To download an article from SID, first log in to the site, search for the article title, and click on the 'Download Article' option.

Q: How can I download an ISI article?

To download an ISI article on SID, enter the keyword or article title in the search bar, view the relevant results, click on the desired article, and select the 'Download Article' option.

Q: How can I access the SID database?

To access the SID database, visit SID.ir, create an account, and log in to access scientific resources.

Q: Is downloading articles from SID free?

Some articles on SID are available for free, while others require payment. Details are specified on the article's page.

NIARAKI ASLI R.; SALEMI H.

Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Paper

Paper Information

Journal: NASHRIYYAH -I MUHANDISI -I BARQ VA MUHANDISI -I KAMPYUTAR -I IRAN, B- MUHANDISI -I KAMPYUTAR Year:2017 | Volume:15 | Issue:3 Page(s): 243-250

Download Full-Text

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Persian Verion

View:

735

Download:

Cites:

Information Journal Paper

Title

OBSERVABLE OPTIMIZED SELECTIVE HARDENING OF COMBINATIONAL CIRCUITS AGAINST SOFT-ERROR

Author(s)

NIARAKI ASLI R. | SALEMI H. | Issue Writer Certificate

Keywords

SOFT ERRORQ1

COMBINATIONAL CIRCUITQ1

OBSERVABILITYQ1

RELIABILITYQ1

CRITICAL CHARGEQ1

Abstract

Due to the shrinking of feature size, reduction in supply voltage and technology scaling, the sensitivity to radiation induced transient faults of digital systems has dramatically increased. SOFT ERROR causes transient distortion in circuit operation and is expected to become very important in combinational logic with increment of the circuit frequency. In this paper, we introduce an optimized method for hardening of combinational logic circuits against SOFT ERRORs. In this method, first we have found the most sensitive nodes of the circuit by OBSERVABILITY computations. Next for optimizing power-delay product and area, the RELIABILITY of the circuit has been computed and the number of the necessary nodes for hardening will be identified. In the next step, three different hardening methods including time redundancy, Schmitt trigger and transistor feedback have been carried out on standard test circuits as our vehicles. The comparison of three method results show that the hardened circuits with Schmitt trigger have the most cumulative CRITICAL CHARGE and the least power-delay product and lead to an optimum hardening. Moreover, the simulation results approve the optimized hardening is obtained from suitable selecting the number of required nodes considering OBSERVABILITY concepts and RELIABILITY computations together with the best node hardening method. Monte-Carlo simulations also approve the performance of the proposed method against process variations.

Cites

No record.

References

MOCA ARM: ANALOG RELIABILITY MEASUREMENT BASED ON MONTE CARLO ANALYSIS

Cite

APA: Copy

NIARAKI ASLI, R., & SALEMI, H.. (2017). OBSERVABLE OPTIMIZED SELECTIVE HARDENING OF COMBINATIONAL CIRCUITS AGAINST SOFT-ERROR. NASHRIYYAH -I MUHANDISI -I BARQ VA MUHANDISI -I KAMPYUTAR -I IRAN, B- MUHANDISI -I KAMPYUTAR, 15(3), 243-250. SID. https://sid.ir/paper/228367/en

Vancouver: Copy

NIARAKI ASLI R., SALEMI H.. OBSERVABLE OPTIMIZED SELECTIVE HARDENING OF COMBINATIONAL CIRCUITS AGAINST SOFT-ERROR. NASHRIYYAH -I MUHANDISI -I BARQ VA MUHANDISI -I KAMPYUTAR -I IRAN, B- MUHANDISI -I KAMPYUTAR[Internet]. 2017;15(3):243-250. Available from: https://sid.ir/paper/228367/en

IEEE: Copy

R. NIARAKI ASLI, and H. SALEMI, “OBSERVABLE OPTIMIZED SELECTIVE HARDENING OF COMBINATIONAL CIRCUITS AGAINST SOFT-ERROR,” NASHRIYYAH -I MUHANDISI -I BARQ VA MUHANDISI -I KAMPYUTAR -I IRAN, B- MUHANDISI -I KAMPYUTAR, vol. 15, no. 3, pp. 243–250, 2017, [Online]. Available: https://sid.ir/paper/228367/en

Related Journal Papers