MICROSTRUCTURAL STUDY OF SILICON NITRIDE WHISKERS PRODUCED BY NITRIDATION OF PLASMA-SPRAYED SILICON LAYERS

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ALAEE M.S.

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Journal Paper

Paper Information

Journal: Iranian Journal of Materials Science and Engineering Year:2006 | Volume:3 | Issue:1-2 Page(s): 7-11

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Information Journal Paper

Title

MICROSTRUCTURAL STUDY OF SILICON NITRIDE WHISKERS PRODUCED BY NITRIDATION OF PLASMA-SPRAYED SILICON LAYERS

Author(s)

ALAEE M.S.

Keywords

PLASMA SPRAY

SILICON NITRIDE

CONTAMINATION. WHISKERS

SURFACE ANALYSIS

MICROSTRUCTURE

Abstract

plasma-sprayed silicon layers have been used to produce SILICON NITRIDE layers with fibrous MICROSTRUCTURE which optimizes fracture toughness and strength. SEM examination of the specimens shows that the surface is covered by fine needles and whiskers of Si3N4.In order to study the oxygen contamination effect as well as other contaminants introduced during spraying and nitridation processes, surface sensitive analysis techniques like AES and XPS have been used to determine concentration of these contaminants.

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APA: Copy

ALAEE, M.S.. (2006). MICROSTRUCTURAL STUDY OF SILICON NITRIDE WHISKERS PRODUCED BY NITRIDATION OF PLASMA-SPRAYED SILICON LAYERS. IRANIAN JOURNAL OF MATERIALS SCIENCE AND ENGINEERING, 3(1-2), 7-11. SID. https://sid.ir/paper/276678/en

Vancouver: Copy

ALAEE M.S.. MICROSTRUCTURAL STUDY OF SILICON NITRIDE WHISKERS PRODUCED BY NITRIDATION OF PLASMA-SPRAYED SILICON LAYERS. IRANIAN JOURNAL OF MATERIALS SCIENCE AND ENGINEERING[Internet]. 2006;3(1-2):7-11. Available from: https://sid.ir/paper/276678/en

IEEE: Copy

M.S. ALAEE, “MICROSTRUCTURAL STUDY OF SILICON NITRIDE WHISKERS PRODUCED BY NITRIDATION OF PLASMA-SPRAYED SILICON LAYERS,” IRANIAN JOURNAL OF MATERIALS SCIENCE AND ENGINEERING, vol. 3, no. 1-2, pp. 7–11, 2006, [Online]. Available: https://sid.ir/paper/276678/en

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