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Information Journal Paper

Title

SECOND HARMONIC GENERATION (SHG) MEASUREMENT AFFECTED BY ELECTRIC FIELD

Pages

  236-239

Keywords

Not Registered.

Abstract

 A type II (eoe: extraordinary-ordinary-extraordinary) phase matching condition in a 2nd Harmonic Generation of Nd-YAG laser under a high electric field in a uniaxial KDP crystal has been measured. Type II phase matching takes place when the two mixing waves are of orthogonal polarizations (extraordinary-ordinary) and the 2nd harmonic radiation corresponds to an extraordinary wave. By applying an electric field along the X(Y) axes of the crystal, a new phase-matching angle was measured under the influence of different electric fields. The deflection angle of the SHG beam was measured as a function of the applied voltage. An optical collector will focus the 1st harmonic and a fraction of its 2nd harmonic generation used in surgical operations.

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    APA: Copy

    AMJADI, A., RAJAI, P., & LATIFI, H.. (2007). SECOND HARMONIC GENERATION (SHG) MEASUREMENT AFFECTED BY ELECTRIC FIELD. SCIENTIA IRANICA, 14(3), 236-239. SID. https://sid.ir/paper/289400/en

    Vancouver: Copy

    AMJADI A., RAJAI P., LATIFI H.. SECOND HARMONIC GENERATION (SHG) MEASUREMENT AFFECTED BY ELECTRIC FIELD. SCIENTIA IRANICA[Internet]. 2007;14(3):236-239. Available from: https://sid.ir/paper/289400/en

    IEEE: Copy

    A. AMJADI, P. RAJAI, and H. LATIFI, “SECOND HARMONIC GENERATION (SHG) MEASUREMENT AFFECTED BY ELECTRIC FIELD,” SCIENTIA IRANICA, vol. 14, no. 3, pp. 236–239, 2007, [Online]. Available: https://sid.ir/paper/289400/en

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