مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

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Information Journal Paper

Title

NANO-STRUCTURE AND ELECTRICAL PROPERTIES OF TITANIUM THIN FILMS AS A FUNCTION OF SUBSTRATE TEMPERATURE

Pages

  37-41

Abstract

 The nano-structural and electrical properties of titanium thin film of 237 nm thickness deposited with a rate of 3.0 nms-1 on glass substrates at different substrate temperatures (390, 470, 510 and 580 K) are studied. The nanostructure of these films was obtained using x-ray diffraction (XRD) and atomic force microscopy (AFM), while the thickness were measured by means of Rutherford back scattering (RBS). XRD results show the development of A (112) TiO2 preferred orientation by increasing the substrate temperature. The results also show that the GRAIN SIZE, the ROUGHNESS and the CONDUCTIVITY of these films increase with substrate temperature.

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    APA: Copy

    KHOJIER, K., SAVALONI, H., & GHORANNEVISS, M.. (2008). NANO-STRUCTURE AND ELECTRICAL PROPERTIES OF TITANIUM THIN FILMS AS A FUNCTION OF SUBSTRATE TEMPERATURE. JOURNAL OF THEORETICAL AND APPLIED PHYSICS (IRANIAN PHYSICAL JOURNAL), 2(2), 37-41. SID. https://sid.ir/paper/318631/en

    Vancouver: Copy

    KHOJIER K., SAVALONI H., GHORANNEVISS M.. NANO-STRUCTURE AND ELECTRICAL PROPERTIES OF TITANIUM THIN FILMS AS A FUNCTION OF SUBSTRATE TEMPERATURE. JOURNAL OF THEORETICAL AND APPLIED PHYSICS (IRANIAN PHYSICAL JOURNAL)[Internet]. 2008;2(2):37-41. Available from: https://sid.ir/paper/318631/en

    IEEE: Copy

    K. KHOJIER, H. SAVALONI, and M. GHORANNEVISS, “NANO-STRUCTURE AND ELECTRICAL PROPERTIES OF TITANIUM THIN FILMS AS A FUNCTION OF SUBSTRATE TEMPERATURE,” JOURNAL OF THEORETICAL AND APPLIED PHYSICS (IRANIAN PHYSICAL JOURNAL), vol. 2, no. 2, pp. 37–41, 2008, [Online]. Available: https://sid.ir/paper/318631/en

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