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Information Journal Paper

Title

SURFACE AND NEAR SURFACE ANALYSIS BY ION BEAM TECHNIQUES

Pages

  36-40

Keywords

Not Registered.

Abstract

 he specific aspects of Ion Beam Analysis (IBA) for near surface and thin film characterization are discussed.The application of IBA techniques in material science, surface physics, thin film deposition and crystal growth has been investigated. In this paper, we report some new obtained results in Van De Graaff Laboratory on the different samples after installation of Channeling and Micro-Beam systems. The aim of this paper is description of the IBA techniques capabilities in material analysis.

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    APA: Copy

    BAGHIZADEH, ALI, AGHA ALIGOL, DAVOUD, TALEBI TAHER, ALIREZA, LAMEHI RACHTI, MOHAMMAD, & MORADI, MAHMOOD. (2007). SURFACE AND NEAR SURFACE ANALYSIS BY ION BEAM TECHNIQUES. JOURNAL OF THEORETICAL AND APPLIED PHYSICS (IRANIAN PHYSICAL JOURNAL), 1(1), 36-40. SID. https://sid.ir/paper/318667/en

    Vancouver: Copy

    BAGHIZADEH ALI, AGHA ALIGOL DAVOUD, TALEBI TAHER ALIREZA, LAMEHI RACHTI MOHAMMAD, MORADI MAHMOOD. SURFACE AND NEAR SURFACE ANALYSIS BY ION BEAM TECHNIQUES. JOURNAL OF THEORETICAL AND APPLIED PHYSICS (IRANIAN PHYSICAL JOURNAL)[Internet]. 2007;1(1):36-40. Available from: https://sid.ir/paper/318667/en

    IEEE: Copy

    ALI BAGHIZADEH, DAVOUD AGHA ALIGOL, ALIREZA TALEBI TAHER, MOHAMMAD LAMEHI RACHTI, and MAHMOOD MORADI, “SURFACE AND NEAR SURFACE ANALYSIS BY ION BEAM TECHNIQUES,” JOURNAL OF THEORETICAL AND APPLIED PHYSICS (IRANIAN PHYSICAL JOURNAL), vol. 1, no. 1, pp. 36–40, 2007, [Online]. Available: https://sid.ir/paper/318667/en

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