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Information Journal Paper

Title

STRUCTURAL AND MORPHOLOGICAL PROPERTIES OF ITO THIN FILMS GROWN BY MAGNETRON SPUTTERING

Pages

  285-290

Abstract

 Physical properties of transparent and conducting INDIUM TIN OXIDE (ITO) thin films grown by radiofrequency (RF) MAGNETRON SPUTTERING are studied systematically by changing deposition time. The X-ray diffraction (XRD) data indicate polycrystalline thin films with grain orientations predominantly along the (2 2 2) and (4 0 0) directions. From atomic force microscopy (AFM) it is found that by increasing the deposition time, the roughness of the film increases. Scanning electron microscopy (SEM) images show a network of a high-porosity interconnected nanoparticles, which approximately have a pore size ranging between 20 and 30 nm. Optical measurements suggest an average transmission of 80 % for the ITO films. Sheet resistances are investigated using four-point probes, which imply that by increasing the film THICKNESS the resistivities of the films decrease to 2.43 × 10-5  W cm.

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    APA: Copy

    GHORANNEVIS, Z., AKBARNEJAD, E., & GHORANNEVISS, M.. (2015). STRUCTURAL AND MORPHOLOGICAL PROPERTIES OF ITO THIN FILMS GROWN BY MAGNETRON SPUTTERING. JOURNAL OF THEORETICAL AND APPLIED PHYSICS (IRANIAN PHYSICAL JOURNAL), 9(4), 285-290. SID. https://sid.ir/paper/318858/en

    Vancouver: Copy

    GHORANNEVIS Z., AKBARNEJAD E., GHORANNEVISS M.. STRUCTURAL AND MORPHOLOGICAL PROPERTIES OF ITO THIN FILMS GROWN BY MAGNETRON SPUTTERING. JOURNAL OF THEORETICAL AND APPLIED PHYSICS (IRANIAN PHYSICAL JOURNAL)[Internet]. 2015;9(4):285-290. Available from: https://sid.ir/paper/318858/en

    IEEE: Copy

    Z. GHORANNEVIS, E. AKBARNEJAD, and M. GHORANNEVISS, “STRUCTURAL AND MORPHOLOGICAL PROPERTIES OF ITO THIN FILMS GROWN BY MAGNETRON SPUTTERING,” JOURNAL OF THEORETICAL AND APPLIED PHYSICS (IRANIAN PHYSICAL JOURNAL), vol. 9, no. 4, pp. 285–290, 2015, [Online]. Available: https://sid.ir/paper/318858/en

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