Information Journal Paper
APA:
CopyBOZORGNIA, Y., & BERTERO, V.V.. (2002). IMPROVED DAMAGE PARAMETERS FOR POST-EARTHQUAKE APPLICATIONS. PROCEEDING OF INTERNATIONAL SEMINAR ON ELECTRONICS TECHNOLOGY ISSUE, -(-), 61-82. SID. https://sid.ir/paper/544040/en
Vancouver:
CopyBOZORGNIA Y., BERTERO V.V.. IMPROVED DAMAGE PARAMETERS FOR POST-EARTHQUAKE APPLICATIONS. PROCEEDING OF INTERNATIONAL SEMINAR ON ELECTRONICS TECHNOLOGY ISSUE[Internet]. 2002;-(-):61-82. Available from: https://sid.ir/paper/544040/en
IEEE:
CopyY. BOZORGNIA, and V.V. BERTERO, “IMPROVED DAMAGE PARAMETERS FOR POST-EARTHQUAKE APPLICATIONS,” PROCEEDING OF INTERNATIONAL SEMINAR ON ELECTRONICS TECHNOLOGY ISSUE, vol. -, no. -, pp. 61–82, 2002, [Online]. Available: https://sid.ir/paper/544040/en