MEASURING TECHNOLOGICAL BIAS

Q: How can I download an article?

To download an article from SID, first log in to the site, search for the article title, and click on the 'Download Article' option.

Q: How can I download an ISI article?

To download an ISI article on SID, enter the keyword or article title in the search bar, view the relevant results, click on the desired article, and select the 'Download Article' option.

Q: How can I access the SID database?

To access the SID database, visit SID.ir, create an account, and log in to access scientific resources.

Q: Is downloading articles from SID free?

Some articles on SID are available for free, while others require payment. Details are specified on the article's page.

STEVENSON R.

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Paper

Paper Information

Journal: AMERICAN ECONOMIC REVIEW Year:1980 | Volume:70 | Issue:1 Page(s): 162-173

Download Full-Text

View:

149

Download:

Cites:

Information Journal Paper

Title

MEASURING TECHNOLOGICAL BIAS

Author(s)

STEVENSON R.

Keywords

Not Registered.

Abstract

Multimedia

No record.

Cites

THE STUDY OF NATURE AND TREND OF TECHNOLOGICAL CHANGE IN IRAN'S INDUSTRY (1971-2008)
THE ANALYSIS OF TREND OF TECHNOLOGICAL CHANGE IN IRAN'S CEMENT INDUSTRY

References

No record.

Cite

APA: Copy

STEVENSON, R.. (1980). MEASURING TECHNOLOGICAL BIAS. AMERICAN ECONOMIC REVIEW, 70(1), 162-173. SID. https://sid.ir/paper/602069/en

Vancouver: Copy

STEVENSON R.. MEASURING TECHNOLOGICAL BIAS. AMERICAN ECONOMIC REVIEW[Internet]. 1980;70(1):162-173. Available from: https://sid.ir/paper/602069/en

IEEE: Copy

R. STEVENSON, “MEASURING TECHNOLOGICAL BIAS,” AMERICAN ECONOMIC REVIEW, vol. 70, no. 1, pp. 162–173, 1980, [Online]. Available: https://sid.ir/paper/602069/en

Related Journal Papers

No record.

Related Seminar Papers

No record.

Related Plans

No record.

Recommended Workshops