Information Journal Paper
APA:
CopyROY, D., & FENDLER, J.. (2004). REFLECTION AND ABSORPTION TECHNIQUES FOR OPTICAL CHARACTERIZATION OF CHEMICALLY ASSEMBLED NANOMATERIALS. ADVANCED MATERIALS, 16(-), 479-508. SID. https://sid.ir/paper/634280/en
Vancouver:
CopyROY D., FENDLER J.. REFLECTION AND ABSORPTION TECHNIQUES FOR OPTICAL CHARACTERIZATION OF CHEMICALLY ASSEMBLED NANOMATERIALS. ADVANCED MATERIALS[Internet]. 2004;16(-):479-508. Available from: https://sid.ir/paper/634280/en
IEEE:
CopyD. ROY, and J. FENDLER, “REFLECTION AND ABSORPTION TECHNIQUES FOR OPTICAL CHARACTERIZATION OF CHEMICALLY ASSEMBLED NANOMATERIALS,” ADVANCED MATERIALS, vol. 16, no. -, pp. 479–508, 2004, [Online]. Available: https://sid.ir/paper/634280/en