Information Journal Paper
APA:
Copy. (2019). The role of spatial frequency analysis in correlating atomic force microscopy and optical profilometry with self-etch adhesive enamel bond fatigue durability. Microscopy Research and Technique, 82(9), 1419-1429. SID. https://sid.ir/paper/700031/en
Vancouver:
Copy. The role of spatial frequency analysis in correlating atomic force microscopy and optical profilometry with self-etch adhesive enamel bond fatigue durability. Microscopy Research and Technique[Internet]. 2019;82(9):1419-1429. Available from: https://sid.ir/paper/700031/en
IEEE:
Copy, “The role of spatial frequency analysis in correlating atomic force microscopy and optical profilometry with self-etch adhesive enamel bond fatigue durability,” Microscopy Research and Technique, vol. 82, no. 9, pp. 1419–1429, 2019, [Online]. Available: https://sid.ir/paper/700031/en