Information Seminar Paper
APA:
CopyASHRAFI, MOHAMMAD REZA, KASHEFIAN, ALI, & RASHIDIAN, BIZHAN. (2008). SIMULTANEOUS IN SITU THICKNESS MONITORING OF THIN FILMS AND DETERMINING THEIR DIELECTRIC PROPERTIES BASED ON MULTIPLE INCIDENT LASERS BEAMS. NATIONAL VACUUM CONFERENCE IRAN. SID. https://sid.ir/paper/905420/en
Vancouver:
CopyASHRAFI MOHAMMAD REZA, KASHEFIAN ALI, RASHIDIAN BIZHAN. SIMULTANEOUS IN SITU THICKNESS MONITORING OF THIN FILMS AND DETERMINING THEIR DIELECTRIC PROPERTIES BASED ON MULTIPLE INCIDENT LASERS BEAMS. 2008. Available from: https://sid.ir/paper/905420/en
IEEE:
CopyMOHAMMAD REZA ASHRAFI, ALI KASHEFIAN, and BIZHAN RASHIDIAN, “SIMULTANEOUS IN SITU THICKNESS MONITORING OF THIN FILMS AND DETERMINING THEIR DIELECTRIC PROPERTIES BASED ON MULTIPLE INCIDENT LASERS BEAMS,” presented at the NATIONAL VACUUM CONFERENCE IRAN. 2008, [Online]. Available: https://sid.ir/paper/905420/en