DESIGN AND CONSTRUCTION OF A BENT CRYSTAL SPECTROMETER FOR STUDYING SOFT X-RAYS OF SHARIF PLASMA FOCUS

Q: How can I download an article?

To download an article from SID, first log in to the site, search for the article title, and click on the 'Download Article' option.

Q: How can I download an ISI article?

To download an ISI article on SID, enter the keyword or article title in the search bar, view the relevant results, click on the desired article, and select the 'Download Article' option.

Q: How can I access the SID database?

To access the SID database, visit SID.ir, create an account, and log in to access scientific resources.

Q: Is downloading articles from SID free?

Some articles on SID are available for free, while others require payment. Details are specified on the article's page.

HOSSEINZADEH A.H.; ETAATI G.R.; VOSOUGHI N.

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Paper

Paper Information

Journal: JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY Year:2015 | Volume:- | Issue:73 Page(s): 17-23

Download Full-Text

Persian Verion

View:

1,945

Download:

Cites:

Information Journal Paper

Title

DESIGN AND CONSTRUCTION OF A BENT CRYSTAL SPECTROMETER FOR STUDYING SOFT X-RAYS OF SHARIF PLASMA FOCUS

Author(s)

HOSSEINZADEH A.H. | ETAATI G.R. | VOSOUGHI N. | Issue Writer Certificate

Keywords

PLASMA FOCUSQ2

SPECTROMETERQ2

X-RAYQ2

PINHOLE CAMERAQ2

CURVED CRYSTALQ2

Abstract

A soft X-RAY SPECTROMETER based on Johann's method and an embedded CURVED CRYSTAL which was designed and fabricated for the Sharif University of Technology's PLASMA FOCUS (SUT-PF) is presented in this paper. Focusing rays with the same wavelength at a point to increase the ray intensity is a reason for choosing the cylindrical CURVED CRYSTAL SPECTROMETER since its performance is inspired by Bragg's law. The optimal conditions for the SUT-PF (pressure and voltage) are determined and examined by a photodiode detector and a PINHOLE CAMERA before the experiments. Under the optimal discharge condition for soft X-RAY generation, the recorded spectral lines on the radiography film and the corresponding atomic transitions are measured and analyzed using a suitable arrangement of the SPECTROMETER and PF device. Experimental results confirm that the wavelength of the emitted soft X-RAY from the ionized argon plasma is mainly in the range of 3 to 4 angstrom, where the atomic transition of 1s2-1s2p at the emitted wavelength of 3.943 angstrom has the highest intensity compared to other spectral lines.

Cites

No record.

References

No record.

Cite

APA: Copy

HOSSEINZADEH, A.H., ETAATI, G.R., & VOSOUGHI, N.. (2015). DESIGN AND CONSTRUCTION OF A BENT CRYSTAL SPECTROMETER FOR STUDYING SOFT X-RAYS OF SHARIF PLASMA FOCUS. JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, -(73), 17-23. SID. https://sid.ir/paper/97758/en

Vancouver: Copy

HOSSEINZADEH A.H., ETAATI G.R., VOSOUGHI N.. DESIGN AND CONSTRUCTION OF A BENT CRYSTAL SPECTROMETER FOR STUDYING SOFT X-RAYS OF SHARIF PLASMA FOCUS. JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY[Internet]. 2015;-(73):17-23. Available from: https://sid.ir/paper/97758/en

IEEE: Copy

A.H. HOSSEINZADEH, G.R. ETAATI, and N. VOSOUGHI, “DESIGN AND CONSTRUCTION OF A BENT CRYSTAL SPECTROMETER FOR STUDYING SOFT X-RAYS OF SHARIF PLASMA FOCUS,” JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, vol. -, no. 73, pp. 17–23, 2015, [Online]. Available: https://sid.ir/paper/97758/en

Related Journal Papers