مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Persian Verion

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

video

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

sound

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Persian Version

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

View:

1,152
مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Download:

0
مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Cites:

Information Journal Paper

Title

CLASSIFICATION SENSITIVITY ANALYSIS OF RETURNS TO SCALE IN DEA

Pages

  115-124

Abstract

 Sensitivity analysis of RETURNS TO SCALE are classified by the DEA linear programming has been studied. Seiford at al. [1] were studied the SENSITIVITY ANALYSIS of RETURNS TO SCALE based on two conditions. In this paper, the SENSITIVITY ANALYSIS are discussed in general. For this purpose, the models are presented, which models the type of RETURNS TO SCALE and the stability of the classification of RETURNS TO SCALE is determined. Output changes on the input orientation of the CCR model and input changes the output orientation of the CCR model is considered. In this paper, the SENSITIVITY ANALYSIS of CCR efficient DMU that are inefficient will be considered.

Cites

  • No record.
  • References

  • No record.
  • Cite

    APA: Copy

    HOSSEINZADEH LOTFI, F., GHELEJ BEIGI, Z., GHOLAMI, K., & AGHAEI, N.. (2011). CLASSIFICATION SENSITIVITY ANALYSIS OF RETURNS TO SCALE IN DEA. JOURNAL OF OPERATIONAL RESEARCH AND ITS APPLICATIONS (JOURNAL OF APPLIED MATHEMATICS), 8(3 (30)), 115-124. SID. https://sid.ir/paper/164603/en

    Vancouver: Copy

    HOSSEINZADEH LOTFI F., GHELEJ BEIGI Z., GHOLAMI K., AGHAEI N.. CLASSIFICATION SENSITIVITY ANALYSIS OF RETURNS TO SCALE IN DEA. JOURNAL OF OPERATIONAL RESEARCH AND ITS APPLICATIONS (JOURNAL OF APPLIED MATHEMATICS)[Internet]. 2011;8(3 (30)):115-124. Available from: https://sid.ir/paper/164603/en

    IEEE: Copy

    F. HOSSEINZADEH LOTFI, Z. GHELEJ BEIGI, K. GHOLAMI, and N. AGHAEI, “CLASSIFICATION SENSITIVITY ANALYSIS OF RETURNS TO SCALE IN DEA,” JOURNAL OF OPERATIONAL RESEARCH AND ITS APPLICATIONS (JOURNAL OF APPLIED MATHEMATICS), vol. 8, no. 3 (30), pp. 115–124, 2011, [Online]. Available: https://sid.ir/paper/164603/en

    Related Journal Papers

    Related Seminar Papers

  • No record.
  • Related Plans

  • No record.
  • Recommended Workshops






    Move to top
    telegram sharing button
    whatsapp sharing button
    linkedin sharing button
    twitter sharing button
    email sharing button
    email sharing button
    email sharing button
    sharethis sharing button