مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Persian Verion

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

video

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

sound

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Persian Version

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

View:

549
مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Download:

0
مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Cites:

Information Journal Paper

Title

FAST AND LOW LOST FABRICATION OF SIO2 MICROCANTILEVER BASED ON BULK MICROELECTROMECHANICAL SYSTEM

Pages

  12-20

Abstract

 We know, cantilevers are based for the most of the MEMS components. In this paper, the fabrication process of SiO2 MICRO CANTILEVER array based on BULK MICROMACHINING technology is introduced. The results of which can be used to fabricate of SiO2 MICRO CANTILEVER sensors. The micro-cantilever fabrication process is implemented in the 13th stage with two glass and talcous masks and it is also suspend by wet release technique. The main advantages of the proposed method can be expressed no need for advanced deposition equipment, design with minimum mask, fast and simplicity in implementation of the MICRO CANTILEVER, avoid of complexity release from sacrificial layer, release the MICRO CANTILEVER at environment temperature, low cost price and finally possible to implement in microelectronics research laboratories with limited equipment. The SiO2 MICRO CANTILEVERs fabricate with 1and 2mm thickness, 50, 100, 150, 200, 250, 300, 350 and 400mm lengths, and 20 and 40mm widths. The resonant frequency and the spring constant values are also calculated for different materials (Si3N4, Si, Au, SiO2, Al and SU8) with various sizes. The SEM images results show that the lithographic process is correctly done on the roughness of the backside substrate, the fabrication process and Si etching operations controls are performed suitable, and micro-cantilevers are suspended with negligible stress.

Cites

  • No record.
  • References

  • No record.
  • Cite

    APA: Copy

    ABDOLLAHI, HASSAN. (2017). FAST AND LOW LOST FABRICATION OF SIO2 MICROCANTILEVER BASED ON BULK MICROELECTROMECHANICAL SYSTEM. MODARES MECHANICAL ENGINEERING, 17(5 ), 12-20. SID. https://sid.ir/paper/179214/en

    Vancouver: Copy

    ABDOLLAHI HASSAN. FAST AND LOW LOST FABRICATION OF SIO2 MICROCANTILEVER BASED ON BULK MICROELECTROMECHANICAL SYSTEM. MODARES MECHANICAL ENGINEERING[Internet]. 2017;17(5 ):12-20. Available from: https://sid.ir/paper/179214/en

    IEEE: Copy

    HASSAN ABDOLLAHI, “FAST AND LOW LOST FABRICATION OF SIO2 MICROCANTILEVER BASED ON BULK MICROELECTROMECHANICAL SYSTEM,” MODARES MECHANICAL ENGINEERING, vol. 17, no. 5 , pp. 12–20, 2017, [Online]. Available: https://sid.ir/paper/179214/en

    Related Journal Papers

    Related Seminar Papers

  • No record.
  • Related Plans

  • No record.
  • Recommended Workshops






    Move to top
    telegram sharing button
    whatsapp sharing button
    linkedin sharing button
    twitter sharing button
    email sharing button
    email sharing button
    email sharing button
    sharethis sharing button