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Cites:

1

Information Journal Paper

Title

DETERMINATION OF POROUS SILICON THERMAL CONDUCTIVITY USING THE “MIRAGE EFFECT” METHOD

Pages

  267-272

Abstract

 MIRAGE EFFECT is contactless and NON DESTRUCTIVE METHOD which has been used a lot to determine thermal properties of different kind of samples, transverse PHOTOTHERMAL DEFLECTION PTD in skimming configuration with ccd camera and special programs is used to determine THERMAL CONDUCTIVITY of POROUS SILICON ps FILM. Ps samples were prepared by ELECTROCHEMICAL ETCHING. THERMAL CONDUCTIVITY with porosity changing was measured and the experiments result compared with theoretical results, and they were almost the same.

Cites

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    • Cite

    APA: Copy

    ALFEEL, FATEN, AWAD, F., & QAMAR, F.. (2014). DETERMINATION OF POROUS SILICON THERMAL CONDUCTIVITY USING THE “MIRAGE EFFECT” METHOD. INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND), 5(3 (17)), 267-272. SID. https://sid.ir/paper/322235/en

    Vancouver: Copy

    ALFEEL FATEN, AWAD F., QAMAR F.. DETERMINATION OF POROUS SILICON THERMAL CONDUCTIVITY USING THE “MIRAGE EFFECT” METHOD. INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND)[Internet]. 2014;5(3 (17)):267-272. Available from: https://sid.ir/paper/322235/en

    IEEE: Copy

    FATEN ALFEEL, F. AWAD, and F. QAMAR, “DETERMINATION OF POROUS SILICON THERMAL CONDUCTIVITY USING THE “MIRAGE EFFECT” METHOD,” INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND), vol. 5, no. 3 (17), pp. 267–272, 2014, [Online]. Available: https://sid.ir/paper/322235/en

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