مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

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1

Information Journal Paper

Title

INVESTIGATIONS ON STRUCTURAL AND ELECTRICAL PROPERTIES OF CADMIUM ZINC SULFIDE THIN FILMS

Pages

  433-438

Abstract

 Nowadays, II- IV group semiconductor thin films have attracted considerable attention from the research community because of their wide range of application in the fabrication of SOLAR CELLs and other opto-electronic devices. CADMIUM ZINC SULFIDE (Zn-CdS) thin films were grown by chemical bath deposition (CBD) technique. X-ray diffraction (XRD) is used to analyze the structure and crystallite size and scanning electron microscopy is used to study the morphology of Zn-CdS thin film. Optical studies have been carried out using UV-Visible-NIR transmission spectrum. The dielectric properties of Zn-CdS thin films have been studied in the different frequency at different temperatures. The AC conductivity study shows a normal dielectric behavior with frequency which reveals that the dispersion is due to the interfacial polarization.

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    • Cite

    APA: Copy

    SURESH, SAGADEVAN, & PANDURANGAN, K.. (2015). INVESTIGATIONS ON STRUCTURAL AND ELECTRICAL PROPERTIES OF CADMIUM ZINC SULFIDE THIN FILMS. INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND), 6(4), 433-438. SID. https://sid.ir/paper/322300/en

    Vancouver: Copy

    SURESH SAGADEVAN, PANDURANGAN K.. INVESTIGATIONS ON STRUCTURAL AND ELECTRICAL PROPERTIES OF CADMIUM ZINC SULFIDE THIN FILMS. INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND)[Internet]. 2015;6(4):433-438. Available from: https://sid.ir/paper/322300/en

    IEEE: Copy

    SAGADEVAN SURESH, and K. PANDURANGAN, “INVESTIGATIONS ON STRUCTURAL AND ELECTRICAL PROPERTIES OF CADMIUM ZINC SULFIDE THIN FILMS,” INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND), vol. 6, no. 4, pp. 433–438, 2015, [Online]. Available: https://sid.ir/paper/322300/en

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