مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

video

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

sound

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Persian Version

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

View:

426
مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Download:

105
مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Cites:

1

Information Journal Paper

Title

DETECTION OF TEM, SHV AND CTX-M ANTIBIOTIC RESISTANCE GENES IN ESCHERICHIA COLI ISOLATES FROM INFECTED WOUNDS

Pages

  30-35

Abstract

 Background and Objective: ESCHERICHIA COLI is one of the most common causes of hospital-acquired infections. Extended-spectrum b-lactamase (ESBL) -producing E. coli strains are resistant to third-generation cephalosporins. The three main genes involved in ESBL production areTEM, SHV and CTX-M. Detection of ESBL-producing E. coli is of importance for infection control, reduction of excessive antibiotic use and epidemiological surveillance. This study aimed to detect ESBL-producingE. coli strains isolated from wound infections using phenotypic and molecular methods.Methods: During 2013- early 2015, 86 strains were collected from three hospitals in Isfahan, Iran. Antibiotic susceptibility testing was done using ceftazidime and ceftazidime+ clavulanic acid discs. Polymerase chain reaction was used for the detection of the three resistance genes.Results: The resistance genes SHV, CTX-M and TEM were detected in 49 isolates (56.9%). In addition, 39 isolates (45%) were ESBL-producing strains. According to the results, 5 (5.8%), 14 (16.2%), 19 (22%) and 11 (12.7%) isolates contained the SHV, CTX-M, TEM and CTX-M+TEM genes, respectively. The frequency of CTX and TEM were significantly higher than that ofSHV gene (P<0.05). Most of the isolated bacteria were resistant to cefazolin and sensitive to nitrofurantoin.Conclusions: There is a difference between the frequency of ESBL-positive isolates reported in the phenotypic and genotypic methods, which could be due to the lower sensitivity of the phenotypic method and impact of environmental factors on the emergence of antibiotic resistance.

Cites

References

  • No record.
  • Cite

    APA: Copy

    KOMIJANI, MAJID, BOUZARI, MAJID, & RAHIMI, FATEH. (2017). DETECTION OF TEM, SHV AND CTX-M ANTIBIOTIC RESISTANCE GENES IN ESCHERICHIA COLI ISOLATES FROM INFECTED WOUNDS. MEDICAL LABORATORY JOURNAL, 11(2), 30-35. SID. https://sid.ir/paper/693900/en

    Vancouver: Copy

    KOMIJANI MAJID, BOUZARI MAJID, RAHIMI FATEH. DETECTION OF TEM, SHV AND CTX-M ANTIBIOTIC RESISTANCE GENES IN ESCHERICHIA COLI ISOLATES FROM INFECTED WOUNDS. MEDICAL LABORATORY JOURNAL[Internet]. 2017;11(2):30-35. Available from: https://sid.ir/paper/693900/en

    IEEE: Copy

    MAJID KOMIJANI, MAJID BOUZARI, and FATEH RAHIMI, “DETECTION OF TEM, SHV AND CTX-M ANTIBIOTIC RESISTANCE GENES IN ESCHERICHIA COLI ISOLATES FROM INFECTED WOUNDS,” MEDICAL LABORATORY JOURNAL, vol. 11, no. 2, pp. 30–35, 2017, [Online]. Available: https://sid.ir/paper/693900/en

    Related Journal Papers

  • No record.
  • Related Seminar Papers

  • No record.
  • Related Plans

  • No record.
  • Recommended Workshops






    Move to top
    telegram sharing button
    whatsapp sharing button
    linkedin sharing button
    twitter sharing button
    email sharing button
    email sharing button
    email sharing button
    sharethis sharing button