COMPARISON OF PHOTON CONTAMINATION BETWEEN LEAD FREE AND FLEXIBLE INTERNAL SHIELD AND LEAD FOR 6 AND 9 MEV ELECTRON BEAMS OF VARIAN 2100 C/D

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TAHMASEBI BIRGANI MOHAMMAD JAVAD; ZABIHZADEH MANSOUR; ALIAKBARI SAEIDEH; ABDOLVAND NEDA; SHAMS AZIN

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Journal: Jundishapur Scientific Medical Journal Year:2017 | Volume:16 | Issue:1 Page(s): 35-44

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Title

COMPARISON OF PHOTON CONTAMINATION BETWEEN LEAD FREE AND FLEXIBLE INTERNAL SHIELD AND LEAD FOR 6 AND 9 MEV ELECTRON BEAMS OF VARIAN 2100 C/D

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Keywords

PHOTON CONTAMINATIONQ1

ELECTRON THERAPYQ1

MONTE CARLO SIMULATIONQ2

INTERNAL SHIELDQ1

Abstract

Background and Objective: In the recent decades the MONTE CARLO SIMULATION in the field of radiation therapy has been used a lot. In this study PHOTON CONTAMINATION of Lead free and flexible INTERNAL SHIELD was investigated in the electron field.Subjects and Methods: To evaluate PHOTON CONTAMINATIONthat caused by this new material in the electron field by Mont Carlo study. Varian 2100 C/D was validated within measurement and then by given energy spectrum shield thickness and PHOTON CONTAMINATION were obtained and compared to those of lead. Results: The results show that this material required 1.2 times thickness of those leadfor providing protection. In addition, it causes PHOTON CONTAMINATION approximately equal those of lead for energy 6 and 9 MeV.Conclusions: It can be concluded that thickness of specific combination (70% W, 18.61% Ni, 11.39% c) which has equal transmission same as lead caused PHOTON CONTAMINATION equal those of Lead that it can be acceptable under clinical condition.

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APA: Copy

TAHMASEBI BIRGANI, MOHAMMAD JAVAD, ZABIHZADEH, MANSOUR, ALIAKBARI, SAEIDEH, ABDOLVAND, NEDA, & SHAMS, AZIN. (2017). COMPARISON OF PHOTON CONTAMINATION BETWEEN LEAD FREE AND FLEXIBLE INTERNAL SHIELD AND LEAD FOR 6 AND 9 MEV ELECTRON BEAMS OF VARIAN 2100 C/D. JUNDISHAPUR SCIENTIFIC MEDICAL JOURNAL, 16(1 ), 35-44. SID. https://sid.ir/paper/12954/en

Vancouver: Copy

TAHMASEBI BIRGANI MOHAMMAD JAVAD, ZABIHZADEH MANSOUR, ALIAKBARI SAEIDEH, ABDOLVAND NEDA, SHAMS AZIN. COMPARISON OF PHOTON CONTAMINATION BETWEEN LEAD FREE AND FLEXIBLE INTERNAL SHIELD AND LEAD FOR 6 AND 9 MEV ELECTRON BEAMS OF VARIAN 2100 C/D. JUNDISHAPUR SCIENTIFIC MEDICAL JOURNAL[Internet]. 2017;16(1 ):35-44. Available from: https://sid.ir/paper/12954/en

IEEE: Copy

MOHAMMAD JAVAD TAHMASEBI BIRGANI, MANSOUR ZABIHZADEH, SAEIDEH ALIAKBARI, NEDA ABDOLVAND, and AZIN SHAMS, “COMPARISON OF PHOTON CONTAMINATION BETWEEN LEAD FREE AND FLEXIBLE INTERNAL SHIELD AND LEAD FOR 6 AND 9 MEV ELECTRON BEAMS OF VARIAN 2100 C/D,” JUNDISHAPUR SCIENTIFIC MEDICAL JOURNAL, vol. 16, no. 1 , pp. 35–44, 2017, [Online]. Available: https://sid.ir/paper/12954/en

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