Scanning Superconducting Quantum Interference Device Microscopy

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Jalilzadehazar Somayeh; Nikkhesal Ramona; Mirkhalili Seyyed Mostafa

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Journal: IRANIAN JOURNAL OF LABORATORY KNOWLEDGE Year:2019 | Volume:7 | Issue:2 (26) Page(s): 7-14

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Information Journal Paper

Title

Scanning Superconducting Quantum Interference Device Microscopy

Author(s)

Jalilzadehazar Somayeh | Nikkhesal Ramona | Mirkhalili Seyyed Mostafa | Issue Writer Certificate

Keywords

Josephson junction

spatial resolution

Scanning Superconducting Quantum Interference Device Microscopy (Scanning SQUID Microscopy)

Abstract

The Scanning Superconducting Quantum Interference Device Microscopy (SSM) has been used to measure the particle flux, as well as the investigation of superconductivity and ferromagnetic properties. SSM is a tool to capture the image of magnetic contaminants on nonmagnetic surfaces. Almost any low-frequency electrical or magnetic signal capable of converting to a magnetic flux signal is detectable with this microscope. Scanning Superconducting Quantum Interference Device Microscopy (Scanning SQUID Microscopy) applications include study of magnetic and electronic properties of materials, search for thermal energy sources of soil, paleomagnetic studies, biomagnetic research, measuring the temperature and finally identifying and detecting the magnetic structures of the surface on the ground and sea.

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APA: Copy

Jalilzadehazar, Somayeh, Nikkhesal, Ramona, & Mirkhalili, Seyyed Mostafa. (2019). Scanning Superconducting Quantum Interference Device Microscopy. IRANIAN JOURNAL OF LABORATORY KNOWLEDGE, 7(2 (26) ), 7-14. SID. https://sid.ir/paper/269053/en

Vancouver: Copy

Jalilzadehazar Somayeh, Nikkhesal Ramona, Mirkhalili Seyyed Mostafa. Scanning Superconducting Quantum Interference Device Microscopy. IRANIAN JOURNAL OF LABORATORY KNOWLEDGE[Internet]. 2019;7(2 (26) ):7-14. Available from: https://sid.ir/paper/269053/en

IEEE: Copy

Somayeh Jalilzadehazar, Ramona Nikkhesal, and Seyyed Mostafa Mirkhalili, “Scanning Superconducting Quantum Interference Device Microscopy,” IRANIAN JOURNAL OF LABORATORY KNOWLEDGE, vol. 7, no. 2 (26) , pp. 7–14, 2019, [Online]. Available: https://sid.ir/paper/269053/en

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