مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

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Cites:

1

Information Journal Paper

Title

STUDYING OF VARIOUS NANOLITHOGRAPHY METHODS BYUSING SCANNING PROBE MICROSCOPE

Pages

  159-175

Abstract

 The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithographical methods mostly based on making nano-structures is presented.

Cites

References

Cite

APA: Copy

SADEGH HASSANI, S., & SOBAT, Z.. (2011). STUDYING OF VARIOUS NANOLITHOGRAPHY METHODS BYUSING SCANNING PROBE MICROSCOPE. INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND), 1(3), 159-175. SID. https://sid.ir/paper/322037/en

Vancouver: Copy

SADEGH HASSANI S., SOBAT Z.. STUDYING OF VARIOUS NANOLITHOGRAPHY METHODS BYUSING SCANNING PROBE MICROSCOPE. INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND)[Internet]. 2011;1(3):159-175. Available from: https://sid.ir/paper/322037/en

IEEE: Copy

S. SADEGH HASSANI, and Z. SOBAT, “STUDYING OF VARIOUS NANOLITHOGRAPHY METHODS BYUSING SCANNING PROBE MICROSCOPE,” INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND), vol. 1, no. 3, pp. 159–175, 2011, [Online]. Available: https://sid.ir/paper/322037/en

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