مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

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Information Journal Paper

Title

A study of emerging semi-conductor devices for memory applications (REVIEW ARTICLE)

Pages

  186-202

Abstract

 In this paper, a study of the existing SRAM (Static Random Access Memory) cell topologies using various FET (Field Effect Transistor) low power devices has been done. Various low power based SRAM cells have been reviewed on the basis of different topologies, technology nodes, and techniques implemented. The analysis of MOSFET(Metal Oxide Semiconductor Field Effect Transistor), FinFET( Fin Field Effect Transistor), TFET/fa?page=1&sort=1&ftyp=all&fgrp=all&fyrs=all" target="_blank">CNTFET (Carbon Nano Tube Field Effect Transistor), and TFET (Tunnel Field Effect Transistor) based SRAM cells on the basis of parameters such as stability, Leakage Current, power dissipation, read/write noise margin, access time has been done. HSPICE, TCAD, Synopsys Taurus, and Cadence Virtuoso were some of the software used for simulation. The simulations were done from a few µ, ms to 7nm technology nodes by different authors.

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  • Cite

    APA: Copy

    Ruhil, Shaifali, Khanna, Vandana, Dutta, Umesh, & Shukla, Neeraj Kumar. (2021). A study of emerging semi-conductor devices for memory applications (REVIEW ARTICLE). INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND), 12(3), 186-202. SID. https://sid.ir/paper/997886/en

    Vancouver: Copy

    Ruhil Shaifali, Khanna Vandana, Dutta Umesh, Shukla Neeraj Kumar. A study of emerging semi-conductor devices for memory applications (REVIEW ARTICLE). INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND)[Internet]. 2021;12(3):186-202. Available from: https://sid.ir/paper/997886/en

    IEEE: Copy

    Shaifali Ruhil, Vandana Khanna, Umesh Dutta, and Neeraj Kumar Shukla, “A study of emerging semi-conductor devices for memory applications (REVIEW ARTICLE),” INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND), vol. 12, no. 3, pp. 186–202, 2021, [Online]. Available: https://sid.ir/paper/997886/en

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