AN OVERVIEW OF SCANNING NEAR-FIELD OPTICAL MICROSCOPY IN CHARACTERIZATION OF NANO-MATERIALS

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SOBAT Z.; SADEGH HASSANI S.

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Journal Paper

Paper Information

Journal: International Journal of Nano Dimension Year:2014 | Volume:5 | Issue:3 (17) Page(s): 203-212

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Information Journal Paper

Title

AN OVERVIEW OF SCANNING NEAR-FIELD OPTICAL MICROSCOPY IN CHARACTERIZATION OF NANO-MATERIALS

Author(s)

SOBAT Z. | SADEGH HASSANI S. | Issue Writer Certificate

Keywords

SCANNING NEAR-FIELD OPTICAL MICROSCOPY

SCANNING PROBE MICROSCOPE

NANO STRUCTURES

OPTICAL MICROSCOPY

APERTURE LESS SNOM

PHOTON SCANNING TUNNELING MICROSCOPY

OPTICAL FIBER

Abstract

OPTICAL MICROSCOPY/fa?page=1&sort=1&ftyp=all&fgrp=all&fyrs=all" target="_blank">SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM) is a member of SCANNING PROBE MICROSCOPEs (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the OPTICAL MICROSCOPY and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of diverse SNOM methods mostly based on aperture and aperture-less is presented.

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APA: Copy

SOBAT, Z., & SADEGH HASSANI, S.. (2014). AN OVERVIEW OF SCANNING NEAR-FIELD OPTICAL MICROSCOPY IN CHARACTERIZATION OF NANO-MATERIALS. INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND), 5(3 (17)), 203-212. SID. https://sid.ir/paper/322223/en

Vancouver: Copy

SOBAT Z., SADEGH HASSANI S.. AN OVERVIEW OF SCANNING NEAR-FIELD OPTICAL MICROSCOPY IN CHARACTERIZATION OF NANO-MATERIALS. INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND)[Internet]. 2014;5(3 (17)):203-212. Available from: https://sid.ir/paper/322223/en

IEEE: Copy

Z. SOBAT, and S. SADEGH HASSANI, “AN OVERVIEW OF SCANNING NEAR-FIELD OPTICAL MICROSCOPY IN CHARACTERIZATION OF NANO-MATERIALS,” INTERNATIONAL JOURNAL OF NANO DIMENSION (IJND), vol. 5, no. 3 (17), pp. 203–212, 2014, [Online]. Available: https://sid.ir/paper/322223/en

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